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SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION BY DIETER K SCHRODER EBOOK

Library of Congress Cataloging-in-Publication Data: Schroder, Dieter K. Semiconductor material and device characterization / by Dieter K. Schroder. p. cm. 10 Feb Dieter K. Schroder Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques. Semiconductor material and device characterization. Front Cover. Dieter K. Schroder. Wiley, – Technology & Engineering – pages.

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Semiconductor material and device characterization Dieter K. Semiconductor Material and Device Characterization.

Semiconductor Material and Device Characterization

Chapter 12 Reliability and Failure Analysis. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.

No eBook available Wiley. This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate semiconducyor field during the past decade. Selected pages Title Page. Selected pages Title Page.

Semiconductor Material and Device Characterization, 3rd Edition

References to this book High Temperature Electronics F. Coverage includes the full range of electrical and optical characterization methods, including the semiconductor material and device characterization by dieter k schroder specialized chemical and physical techniques. Description This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

This chapter also characyerization measurements, including semiconducgor capacitance, scanningKelvin force, scanning spreading resistance, and ballistic electronemission microscopy.

Schroder No preview available – Chapter 11 Chemical and Physical Characterization. Coverage includesthe full range of electrical and optical characterization methods,including the more semiconductor material and device characterization by dieter k schroder chemical and physical techniques. Reliability and Failure Analysis examines failure times anddistribution functions, and discusses electromigration, hotcarriers, gate oxide integrity, negative bias temperatureinstability, stress-induced leakage current, and electrostaticdischarge.

Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding: Schroder Limited preview – No eBook available Wiley. It covers the full range of electrical and optical characterization methods while Chapter 10 Optical Characterization.

Semiconductor material and device characterization – Dieter K. Schroder – Google Books

Updated and revised figures and examples reflecting the mostcurrent data and information new references offering access to the latest research anddiscussions in specialized topics New problems and review questions at the magerial of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

Carrier dieterr Doping Semiconductor material and device characterization by dieter k schroder. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Chargebased and Probe Characterization. Semiconductor material and device characterization Dieter K.

Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes.

Appendix 2 Abbreviations and Acronyms. This Third Edition updates a landmark text with thelatest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist charafterization.

This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.

Schroder Snippet view – You are currently using the site but have requested a page in the site. Not only doesthe Third Edition set forth all the latest measurementtechniques, but it also examines new interpretations and newapplications of existing techniques.

An Instructor’s Manual presenting detailed solutions charzcterization all theproblems in the book is available from the Wiley editorialdepartment.

Charge-Based and Probe Characterization introduces charge-basedmeasurement and Kelvin probes.

Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding:.

An Instructor’s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. Semiconductor Material and Device Characterization.

This chapter also examinesprobe-based measurements, including scanning capacitance, scanningKelvin force, scanning spreading resistance, and ballistic electronemission microscopy. Not only doesthe Semicohductor Edition set forth all the latest measurementtechniques, but it also examines new interpretations and newapplications of existing techniques.